Tactile Device Inspection System, Device, and Method
AssigneeNippon Telegraph and Telephone Corporation
InventorsYuichi Higuchi, Koichi Hadama, Toshiki Wada, Toshihiko Kondo
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AssigneeNippon Telegraph and Telephone Corporation
InventorsYuichi Higuchi, Koichi Hadama, Toshiki Wada, Toshihiko Kondo
Estimating the term…
A tester obtains a test result indicating a subjective evaluation result of a test subject with respect to a traction illusion generated by a sample. A quality checker checks the quality of the sample in accordance with the test result. A measurer performs measurement processing to obtain objective sample characteristic data representing the traction illusion generated by the sample. A feature computer computes a reference feature in accordance with a quality check result and the sample characteristic data. An inspector performs measurement processing to obtain objective inspection target characteristic data representing a traction illusion generated by an inspection target. A determiner computes, for each inspection target, an inspection target feature indicating a feature of a corresponding traction illusion in accordance with the inspection target characteristic data and determines the quality of each inspection target in accordance with a comparison result of the inspection target feature to the reference feature.
-10. (canceled)
A tactile device inspection system for determining quality of tactile devices each configured to generate a traction illusion by vibrations, the tactile device inspection system comprising:
A tactile device inspection apparatus comprising an arithmetic processing circuit for determining quality of tactile devices each configured to generate a traction illusion by vibrations, wherein the arithmetic processing circuit is configured to perform:
A tactile device inspection method of determining quality of tactile devices each configured to generate a traction illusion by vibrations, the tactile device inspection method comprising:
Dependencies are inferred from the claim text.