US 2022/0187133 A1 · Microscale In-Situ Imaging Of Dynamic Temperature And Deformation Fields

Abstract

An embodiment provides a system for measuring temperature and deformation fields of at least a portion of a sample, comprising a visible light camera, an infrared camera, and a beam splitter. The visible light camera is at a first location with respect to the sample and can take a visible light image of at least a portion of the sample at a first time. The infrared camera is at a second location with respect to the sample and can take an infrared image of the at least a portion of the sample at the first time. The beam splitter can receive a beam of light, comprising infrared and visible light, traveling in a direction normal to the at least a portion of the sample and direct the infrared light to the infrared camera and the visible light to the visible light camera.

Claims39

Dependent claims

A system comprising:

a visible light camera at a first location with respect to a sample, the visible light camera configured to take a visible light image of at least a portion of the sample at a first time;
an infrared camera at a second location with respect to the sample, the infrared camera configured to take an infrared image of the at least a portion of the sample at the first time;
and
one or more calibrating sources configured to calibrate the visible light camera and the infrared camera.

1 more element

A method comprising:

simultaneously recording visible light images with a visible light camera and infrared images with an infrared camera of a target area of at least a portion of a sample over a predetermined time interval;
and at least one of:
calibrating the visible light camera and the infrared camera using one or more blackbody sources;
and
synchronizing the visible light camera and the infrared camera, wherein synchronizing the visible light camera and the infrared camera comprises:
simultaneously transmitting activating signals to the visible light camera and the infrared camera;
positioning a calibration target;
taking a visible light image of the calibration target using the visible light camera;
taking an infrared image of the calibration target using the infrared camera;
measuring a spatial resolution of the visible light image;
measuring a spatial resolution of the infrared image;
defining a reference point for the visible light and infrared images;
and
spatially synchronizing the visible light and infrared images using the reference point and spatial resolution of the visible light and infrared images.

11 more elements

Dependencies are inferred from the claim text.

Microscale In-Situ Imaging Of Dynamic Temperature And Deformation Fields

Life of this patent

Microscale In-Situ Imaging Of Dynamic Temperature And Deformation Fields

Life of this patent

Abstract

Claims39