Surface contour measurement
AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
Life of this patent
Estimating the term…
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AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
Estimating the term…
An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from an sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is not reflected by the second non-polarizing beam splitter.
An optical scanning system, comprising:
Dependencies are inferred from the claim text.