US 2022/0178998 A1 · CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD

Abstract

A circuit screening system includes a target circuit under test, a power circuit, and a clock generating circuit. The target circuit under test receives a first testing signal in a first period, and a second testing signal in a second period, and the first testing signal is different from the second testing signal. The power circuit provides a supply voltage to the target circuit under test, wherein a voltage level of the supply voltage maintains at a first voltage level in the first period, is pulled up to a second voltage level and back to the first level after the first period, and maintains at the first voltage level in a second period after the first period. The clock generating circuit provides a clock signal to the target circuit under test, wherein the clock signal has different profiles in the first period and the second period.

Claims20

Dependent claims

A circuit screening system, comprising:

a target circuit under test, configured to receive a first testing signal in a first period, and a second testing signal in a second period, and the first testing signal is different from the second testing signal;
a power circuit, coupled to the target circuit under test, configured to provide a supply voltage to the target circuit under test, wherein a voltage level of the supply voltage maintains at a first voltage level in the first period, is pulled up to a second voltage level and back to the first level after the first period, and maintains at the first voltage level in a second period after the first period;
and
a clock generating circuit, configured to provide a clock signal to the target circuit under test, wherein the clock signal has different profiles in the first period and the second period to trigger the target circuit under test receive to receive the first testing signal in the first period and the second testing signal in the second period.

1 more element

A circuit screening method, comprising:

operating in a first input stage, in which a first testing signal is inputted into a target circuit under test, a supply voltage, whose voltage level locates in an input range, is provided to the target circuit under test, and a clock signal having a first profile is provided to the target circuit under test;
operating in a first stress stage after the first input stage, in which the voltage level of the supply voltage locates in a stress range higher than the input range;
operating in a second input stage after the first stress stage, in which a second testing signal different from the first testing signal is inputted into the test target circuit under test, and the supply voltage, whose voltage level relocates in the input range from the stress range, is provided to the test target circuit under test, and a clock signal having a second profile different from the first profile is provided to the target circuit under test.

Dependencies are inferred from the claim text.

Circuit screening system and circuit screening method

Life of this patent

Circuit screening system and circuit screening method

Life of this patent

Abstract

Claims20