Semiconductor devices for improved measurements and related methods

Abstract

Semiconductor devices, and in particular semiconductor devices for improved resistance measurements and related methods are disclosed. Contact structures for semiconductor devices are disclosed that provide access to resistance measurements with reduced influence of testing-related resistances, thereby improving testing accuracy, particularly for semiconductor devices with low on-resistance ratings. A semiconductor device may include an active region and an inactive region that is arranged along a perimeter of the active region. The semiconductor device may be arranged with a topside contact to provide access for resistance measurements, for example Kelvin-sensing resistance measurements. Related methods include performing resistance measurements from a topside of the semiconductor device, even when the active region of the semiconductor device forms a vertical contact structure.

Dependencies are inferred from the claim text.