Optical Analysis Method and Optical Analysis System
AssigneeHitachi, Ltd.
InventorsToshimitsu NOGUCHI, Takuya KAMBAYASHI, Shunsuke KONO, Akihiro NOJIMA
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi, Ltd.
InventorsToshimitsu NOGUCHI, Takuya KAMBAYASHI, Shunsuke KONO, Akihiro NOJIMA
Estimating the term…
An object of the invention is to provide an optical analysis method and an optical analysis system capable of accurately performing an optical analysis by using transmitted light even though a sample contains a turbid substance. The optical analysis method of the present disclosure is an optical analysis method for irradiating a sample s containing a turbid substance in a cell 11 with light and performing optical analysis on the sample s by using transmitted light of the light. The optical analysis method includes: exciting the sample s in the cell 11 by irradiation with ultrasonic waves while adjusting a frequency of the ultrasonic waves such that an intensity of the transmitted light is maximized, and then performing the optical analysis in a state where the sample s is irradiated with ultrasonic waves of this adjusted frequency.
An optical analysis method for irradiating a sample containing a turbid substance in a cell with light and performing optical analysis on the sample by using transmitted light of the light, the optical analysis method comprising:
An optical analysis system configured to irradiate a sample containing a turbid substance in a cell with light and perform an optical analysis on the sample by using transmitted light of the light, the optical analysis system comprising:
Dependencies are inferred from the claim text.