Thickness Detection Device, Method and System
AssigneeWeihai Hualing Opto-Electronics Co., Ltd.
InventorsYonghui LIN, Kai ZHANG, Xiaofeng SUN, Rongxin SONG, Tao QU
Life of this patent
Estimating the term…
Loading patent…
AssigneeWeihai Hualing Opto-Electronics Co., Ltd.
InventorsYonghui LIN, Kai ZHANG, Xiaofeng SUN, Rongxin SONG, Tao QU
Estimating the term…
Disclosed are a thickness detection device, method and system, a storage medium and a processor. The thickness detection device includes: a detection unit, including a plurality of thickness detection chips, wherein the thickness detection chips are sequentially arranged at least in a second direction; and a common unit, arranged opposite and spaced from the detection unit in a first direction, wherein distances between at least two positions of a first surface of the common unit and the detection unit are different, the second direction is perpendicular to the first direction and a moving direction of an object to be detected, and the first surface is a surface of the common unit which is close to the measurement unit.
A thickness detection device, comprising:
(canceled)
(canceled)
Dependencies are inferred from the claim text.