Defect profiling and tracking system for process-manufacturing enterprise

A defect profiling and tracking system for a process-manufacturing enterprise, comprising:

• a memory having computer-readable instructions stored therein;
• a processor configured to execute the computer-readable instructions to access product quality defect data and process parameter data for a plurality of entities of the process-manufacturing enterprise and to encode relationships between the product quality defect data and process parameter data for one or more entities, wherein the processor comprises;
• an entity characterization module configured to analyze product quality defect data for the plurality of entities to identify one or more deviating entities;
• an entity specific process signature (EPS) generator configured to analyze the product quality defect data and the process parameter data for the identified deviating entities to determine a plurality of relationships and/or interactions between quality defects and the process parameters and to generate a unique entity specific process signature (EPS) for each entity;
• and
• an EPS fuzzy matcher module configured to compare a plurality of real-time process signatures of each entity with EPS corresponding to the entity to detect one or more EPS matches, wherein the EPS matches are indicative of a quality defect and/or a process deviation.

A defect profiling and tracking method for a process-manufacturing enterprise, the method comprising:

• accessing entity data for a plurality of entities of the process-manufacturing enterprise, wherein the entity data comprises at least one of product specifications, a defect type, defect specifications and location information;
• accessing process parameter data for one or more deviating entities, wherein the process parameter data comprises at least one of process readings, setup points and defect labels for the respective entities;
• analyzing the entity data and the process parameter data for each of the deviating entities to determine a plurality of relationships and/or interactions between quality defects and the process parameters and to generate a unique entity specific process signature (EPS) for each entity;
• receiving real-time process parameter data for one or more entities to generate a real-time process signature for each of the one or more entities;
• and
• comparing the real-time process signature of each entity with EPS corresponding to the entity to detect one or more EPS matches, wherein the EPS matches are indicative of a quality defect and/or a process deviation.