System and method for measuring surface tension
AssigneeUnited States of America as represented by the Administrator of NASA
InventorsNevin B. Brosius, Ranganathan Narayanan, Michael P. SanSoucie
Life of this patent
Estimating the term…
Loading patent…
AssigneeUnited States of America as represented by the Administrator of NASA
InventorsNevin B. Brosius, Ranganathan Narayanan, Michael P. SanSoucie
Estimating the term…
Various examples are provided related to measuring surface tension. In one example, a method includes levitating a sample using electrostatic levitation; applying a signal to at least one electrode to excite the sample into a n=3 mode of oscillation; capturing images of the sample with a respective image being associated with a particular frequency that is applied to the sample when the respective image is captured; quantifying sample resonance using a projection method of Legendre polynomials based on the plurality of images; and determining a measured resonance frequency of the sample by an analysis of the sample resonance. The sample can be levitated using a feedback-controlled voltage and the applied signal can be swept over a range of frequencies. A system including electrodes, a position sensor, a camera device, and at least one computing device can be used to carry out the method.
A method, comprising:
A system, comprising:
Dependencies are inferred from the claim text.