Position-measuring device for measuring an absolute position
AssigneeIC-Haus GmbH
InventorsPeter FISCHER, Manfred HERZ, Christian KÜLLER, Christian WACHTER, Hartmut SCHERNER
Life of this patent
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Abstract
A position-measuring device and a corresponding method for measuring an absolute position includes a material measure having a first binary code and a second binary code and a sensor device that scans the first and second binary codes. The sensor device scans the first binary code, which has a first number of code words, each having the same code word length. The second binary code of the material measure forms a portion of the first binary code and has a second number of the code words that can be mapped onto the first binary code.
Claims20
A position-measuring device for measuring an absolute position, the position-measuring device comprising:
- a measuring standard that has a binary code and a sensor device that scans the binary code, wherein the binary code includes a first binary code having a first number of code words that have the same code word length and the sensor device scans the first binary code;
- and
- wherein the binary code includes a second binary code that forms a portion of the first binary code, the second binary code having a second number of code words that can be mapped onto the first binary code.
A method for measuring an absolute position, the method comprising:
- providing a position-measuring device for measuring an absolute position with a measuring standard that has a binary code;
- and
- scanning the binary code with a sensor device, wherein the sensor device scans a first binary code that has a first number of code words that have the same code word length, wherein the binary code of the measuring standard is a binary code that forms a portion of the first binary code with a second number of code words that are mapped onto the first binary code.
Dependencies are inferred from the claim text.