Integrated Spatial Phase Imaging

A method, comprising:

• generating, by a sensor device, a first set of data indicative of a first set of attributes of an object and a second set of data indicative of a second set of attributes of the object, the second set of attributes being different from the first set of attributes;
• generating, by one or more processors, a first set of primitives based on the first set of data;
• generating, by the one or more processors, a second set of primitives based on the second set of data, wherein each of the first and second sets of primitives comprises a respective first-level primitive and a respective second-level primitive;
• generating, by the one or more processors, a combined data set based on the first set of primitives and the second set of primitives;
• and
• determining, by the one or more processors, a plurality of features of the object based on the combined data set.

An integrated wafer-level sensor, comprising:

• a sensor wafer comprising a plurality of sensor devices;
• an optics wafer disposed over a first surface of the sensor wafer, the optics wafer comprising a plurality of focusing elements, each focusing element disposed over a respective one of the plurality of sensor devices;
• and
• a controller wafer disposed at a second surface of the sensor wafer, the controller wafer comprising a plurality of processors, each processor configured to control operation of a respective sensor device and its respective focusing element.