Dual-sided socket device with corrugation structures

A method comprising:

• coupling first conductive contacts of a first packaged device each to a respective one of a first plurality of metallization structures which each extend vertically from a first side of a socket body structure of a socket device, wherein a pitch of the first plurality of metallization structures is in a range of between 0.1 millimeters (mm) and 2 mm;
• and
• coupling second conductive contacts of a second packaged device each to a respective one of a second plurality of metallization structures each extending vertically from a second side of the socket body structure, the second plurality of metallization structures each electrically coupled to a respective one of the first plurality of metallization structures;
• wherein, for each of the first plurality of metallization structures, a vertical span of the metallization structure is in a range of between 0.05 mm and 2.0 mm, a portion of a side of the metallization structure forms a respective corrugation structure, and a horizontal span of the portion is at least 5% of the vertical span of the metallization structure.

A system comprising:

• a first packaged device;
• a second packaged device;
• and
• a socket device comprising:
• a socket body structure comprising a first side, and a second side opposite the first side, wherein the first packaged device and the second packaged device are coupled to the socket device via the first side and the second side, respectively;
• a first plurality of metallization structures which each extend vertically from the first side, wherein a pitch of the first plurality of metallization structures is in a range of between 0.1 millimeters (mm) and 2 mm;
• and
• a second plurality of metallization structures which each extend vertically from the second side, the second plurality of metallization structures each electrically coupled to a respective one of the first plurality of metallization structures;
• wherein, for each of the first plurality of metallization structures, a vertical span of the metallization structure is in a range of between 0.05 mm and 2.0 mm, a portion of a side of the metallization structure forms a respective corrugation structure, and a horizontal span of the portion is at least 5% of the vertical span of the metallization structure.