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US 2022/0102768 A1Published application
Test jig, test device, and test method for secondary battery
AssigneeEspec Corp.
InventorsArata OKUYAMA, Takashi KAJIHARA
Life of this patent
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Abstract
There is provided a test device for a secondary battery, the test device including: a test jig including a nail portion configured to pierce the secondary battery and a heater configured to raise a temperature of the nail portion by being supplied with electric power; and a moving mechanism configured to move the nail portion toward the secondary battery.
Claims10
A test jig for a secondary battery, the test jig comprising:
- a nail portion configured to pierce the secondary battery;
- and
- a heater configured to raise a temperature of the nail portion by being supplied with electric power.
A test method for a secondary battery, the test method comprising:
- a heating step of raising a temperature of a nail portion by a heater;
- and
- a nail piercing step of piercing the nail portion into the secondary battery.
Dependencies are inferred from the claim text.