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US 2022/0102570 A1Published application
P-i-n photodetector
AssigneeEmberion Oy
InventorsAlexander BESSONOV, Mark ALLEN
Life of this patent
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Abstract
A photodetector which comprises a measurement layer (15) and at least a first photoactive layer (11) which covers the measurement layer (15). The measurement layer (15) may be a transistor channel or a charge accumulation electrode. The conductivity type of the measurement layer is n-type, p-type or ambipolar and the first photoactive layer (11) exhibits intrinsic semiconductivity.
Claims8
A photodetector which comprises:
- a substrate with a horizontal substrate surface,
- an electrically conducting gate electrode which defines a first region on the horizontal substrate surface, and an insulating layer which covers the gate electrode in the first region on the horizontal surface,
- a measurement layer which covers the insulating layer at least in the first region on the horizontal substrate surface,
- a vertical stack of photoactive layers which comprises at least a first photoactive layer which covers the measurement layer at least in a second region on the horizontal substrate surface, wherein the second region at least partly overlaps with the first region,
- wherein the first photoactive layer comprises semiconductor nanocrystals, nanoparticles or colloidal quantum dots, the conductivity type of the measurement layer is n-type, p-type or ambipolar, and the first photoactive layer exhibits intrinsic semiconductivity.
2 more elements
Dependencies are inferred from the claim text.