Silicon carbide device with transistor cell and clamp regions in a well region
AssigneeInfineon Technologies AG
InventorsRalf Siemieniec, Wolfgang Jantscher, David Kammerlander, Dethard Peters, Joachim Weyers
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AssigneeInfineon Technologies AG
InventorsRalf Siemieniec, Wolfgang Jantscher, David Kammerlander, Dethard Peters, Joachim Weyers
Estimating the term…
A transistor cell includes a gate electrode and a source region of a first conductivity type. A drain/drift region is formed in a silicon carbide body. A buried region of the second conductivity type and the drain/drift region form a pn junction. The buried region and a well region form a unipolar junction. A mean net dopant density N2 of the buried region is higher than a mean net dopant density N1 of the well region. A first clamp region of the first conductivity type extends into the well region. A first low-resistive ohmic path electrically connects the first clamp region and the gate electrode. A second clamp region of the first conductivity type extends into the well region. A second low-resistive ohmic path electrically connects the second clamp region and the source region.
A silicon carbide device, comprising:
A silicon carbide device, comprising:
A silicon carbide device, comprising:
Dependencies are inferred from the claim text.