Semiconductor device
AssigneeJapan Display Inc.
InventorsKenta KAJIYAMA, Masakazu KAIDA
Life of this patent
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Abstract
A display device and manufacturing method thereof with a high level of reliability is provided without increasing the number of manufacturing processes. The display device includes a first conductor, a first insulation layer including a first contact hole exposing a part of the first conductor, a second insulation layer including a second contact hole exposing at least a part of the first contact hole and a part of a surface of the first insulation layer, a pixel electrode overlapping a part of the second contact hole and electrically connected to the first conductor, and a third insulation layer contacting the first insulation layer via the second contact hole.
Claims5
A semiconductor device comprising:
- a first conductor;
- a first insulation layer on the first conductor, the first insulation layer having a first through hole exposing a part of the first conductor;
- a second insulation layer on the first insulation layer, the second insulation layer having a second through hole exposing a part of the first through hole;
- and
- a second conductor covering a part of the second through hole and electrically connected to the first conductor, wherein
- the first through hole has a first edge and a second edge extending a direction which intersects the first edge,
- the second through hole has a third edge and a fourth edge extending a direction which intersects the third edge,
- the third edge is shorter than the first edge and the second edge, and
- the fourth edge is longer than the first edge and the second edge.
Dependencies are inferred from the claim text.