Abnormality detection system
AssigneeDenso Corporation
InventorSatoshi KOJIMA
Life of this patent
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Abstract
An abnormality detection system includes: a waveform acquisition unit configured to acquire waveform data that changes over time; an abnormality degree calculation unit configured to calculate an abnormality degree based on a cumulative value obtained by accumulating absolute values of differences in data values for each unit time from the waveform data acquired by the waveform acquisition unit; and an abnormality determination unit configured to determine whether the waveform data is normal or abnormal based on the abnormality degree calculated by the abnormality degree calculation unit.
Claims5
An abnormality detection system comprising:
- a waveform acquisition unit configured to acquire waveform data that changes over time;
- an abnormality degree calculation unit configured to calculate an abnormality degree based on a cumulative value obtained by accumulating absolute values of differences in data values for each unit time from the waveform data acquired by the waveform acquisition unit;
- and
- an abnormality determination unit configured to determine whether the waveform data is normal or abnormal based on the abnormality degree calculated by the abnormality degree calculation unit.
Dependencies are inferred from the claim text.