Detect whether die or channel is defective to confirm temperature data

A method comprising:

• causing, by a processing device of a memory device, temperature values to be read from registers at a plurality of memory dice, wherein each temperature value is associated with a temperature at a respective die of the plurality of memory dice;
• causing, by the processing device, error-correcting code (ECC)-protected data to be read from the plurality of memory dice;
• determining, by the processing device, whether an ECC check of the ECC-protected data results in detecting an error;
• in response to detecting the error from the ECC-protected data for a die of the plurality of memory dice, performing, by the processing device, a confirmation check that the error is a result of a defect in the die;
• and
• in response to the confirmation check confirming the die is defective, ignoring, by the processing device, a temperature value from the die when determining whether to trigger a thermal-related operation.

A method comprising:

• causing, by a processing device, temperature values to be read from registers at a plurality of memory dice, wherein each temperature value is associated with a temperature at a respective die of the plurality of memory dice, and wherein the registers are accessible over a plurality of channels coupled to the plurality of memory dice;
• causing, by the processing device, error-correcting code (ECC)-protected data to be read from the plurality of memory dice over the plurality of channels;
• determining, by the processing device, whether an ECC check of the ECC-protected data results in detecting an error;
• in response to detecting the error from the ECC-protected data for a channel of the plurality of channels, performing, by the processing device, a confirmation check that the error is a result of a defect in the channel;
• and
• in response to the confirmation check confirming the channel is defective, ignoring, by the processing device, a temperature value retrieved over the channel when determining whether to trigger a thermal-related operation.