Method for programming 3d nand flash memory
AssigneeChina Flash Co., Ltd.
InventorsHONG NIE, JINGWEI CHEN
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AssigneeChina Flash Co., Ltd.
InventorsHONG NIE, JINGWEI CHEN
Estimating the term…
The present disclosure relates to a method for programming a 3D NAND flash memory, which includes: S1) providing a 3D flash memory array, and eliminating residual charges; S2) strobing a bit line where an upper sub-storage module is located; S3) applying a drain voltage to the drain of a to-be-programmed memory cell, and floating a source thereof; S4) applying a programming voltage to the gate of the to-be-programmed memory cell, to complete programming; and S5) after completing the programming of the upper sub-storage module, and when the upper sub-storage module keeps a programmed state, strobing a bit line where a lower sub-storage module is located, and repeating operation S3) and operation S4) to achieve programming of the lower sub-storage module. In the method for programming a 3D NAND flash memory according to the present disclosure, programming is completed based on tertiary electron collision.
A method for programming a 3D NAND flash memory, comprising:
Dependencies are inferred from the claim text.