Semiconductor device and method of operating the same
AssigneeSK hynix Inc.
InventorJae Hyun HAN
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AssigneeSK hynix Inc.
InventorJae Hyun HAN
Estimating the term…
Provided herein may be a method of operating a semiconductor device including memory cells each storing multi-bit data. The method includes receiving data that is to be programmed in a memory cell selected from the memory cells; and applying a program pulse to the selected memory cell, the program pulse being determined depending on a logic state of the data and being selected from a group including a first program pulse having a positive polarity, a second program pulse having the positive polarity and having at least one of a peak level, a peak period, and a falling slew rate different from those of the first program pulse, a third program pulse having a negative polarity, and a fourth program pulse having the negative polarity and having at least one of a peak level, a peak period, and a rising slew rate different from those of the third program pulse.
A method of operating a semiconductor device including memory cells each storing multi-bit data, the method comprising:
A semiconductor device, comprising:
A method of operating a semiconductor device including memory cells, the method comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.