Non-lambertian surface inspection system for line scan cross reference to related application

A non-Lambertian surface inspection system for line scan, the system comprising:

• a surface inspection part (10) comprising a frame module (110) provided with a curved mounting hole (111) formed on at least one of one surface and the other surface thereof and a photographing hole (112) formed at an upper end thereof, and a plurality of first and second illumination modules (121) and (122) installed in the mounting hole (111) and output light in oblique lines toward an inspection object (A) placed on a bottom surface thereof;
• a camera part (20) positioned above the photographing hole (112), and configured to photograph the inspection object (A) positioned on the bottom surface (B) through the photographing hole (112) and receive an entire reception image (C) comprising a first illumination image (E1) and a second illumination image (E2);
• and
• a controller (30) configured to control operation of the camera part (20), selectively operate the first illumination module (121) and the second illumination module (122), and extract the first illumination image (E1) and the second illumination image (E2) from the entire reception image (C) photographed by the camera part (20), so as to process the same with a preset formula, thereby synthesizing and generating composite images (H1 to H4),
• wherein the controller (30) is configured to turn on the first illumination module (121) for a preset time and then turn off the first illumination module (121), turn on the second illumination module (122) when the first illumination module (121) is turned off, receive the first illumination image (E1) photographed through the camera part (20) when the first illumination module (121) is turned on, and receive the second illumination image (E2) photographed through the camera part (20) when the second illumination module (122) is turned on,
• the controller (30) comprises:
• an illumination image reception module (310) configured to receive the first illumination image (E1) and the second illumination image (E2), which are photographed by the camera part (20), into areas of preset rows or columns;
• an alignment module (320) configured to align a partial image (D1) of a plurality of rows or columns of the first illumination image (E1) with a partial image (D2) of the plurality of rows or columns of the second illumination image (E2);
• a histogram module (330) configured to divide the first illumination image (E1) and the second illumination image (E2) into a plurality of blocks (F), assign a position number to each block (F), and extract a reflectivity value of each block;
• a removal module (340) configured to compare a preset reference reflectivity value with the reflectivity value measured in each block (F), and delete each block (F) having the reflectivity value greater than the reference reflectivity value;
• and
• a block correction image module (350) configured to receive each block in a same position as each deleted block (F) of the first illumination image (E1) from the second illumination image (E2) to generate a first block correction image (G1) by mapping the first illumination image (E1) when each block (F) having the reflectivity value greater than the reference reflectivity value in the first illumination image (E1) is deleted, and receive each block in the same position as each deleted block (F) of the second illumination image (E2) from the first illumination image (E1) to generate a second block correction image (G2) by mapping the second illumination image (E2) when each block (F) having the reflectivity value greater than the reference reflectivity value in the second illumination image (E2) is deleted,
• the controller (30) further comprises a composite image generation module (360) configured to synthesize the first block correction image (G1) and the second block correction image (G2) after calculating the same according to the preset formula, so as to generate the composite images (H),
• the composite image generation module (360) is configured to process the composite image (H) into an albedo image (H1) in a setting area of the composite image (H), process the composite image (H) into an X-axis partial differential image (H2) obtained by calculating a change amount of a surface height of the inspection object in an X-axis direction in the composite image (H), process the composite image (H) into a Y-axis partial differential image (H3) obtained by calculating a change amount of the surface height of the inspection object in a Y-axis direction in the composite image (H), or process the X-axis partial differential image (H2) and the Y-axis partial differential image (H3) into a second partial differential image (H4) obtained by respectively calculating the change amounts of the surface height of the inspection object in the X-axis direction and the Y-axis direction.