System and method utilizing multi-point autofocus to align an optical axis of an optical assembly portion to be normal to a workpiece surface
AssigneeMitutoyo Corporation
InventorCasey Edward Emtman
Life of this patent
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AssigneeMitutoyo Corporation
InventorCasey Edward Emtman
Estimating the term…
A metrology system includes an optical assembly portion; an adjustment mechanism configured to change a distance and an angular orientation between the optical assembly portion and a workpiece surface; and a processor configured to control the adjustment mechanism to move the optical assembly portion to position a workpiece surface within a focal Z autofocus range; capture an image stack of the workpiece surface wherein each image of the image stack corresponds to a different autofocus height; determine an autofocus height for at least three locations of the workpiece surface; control the adjustment mechanism based on the autofocus heights to rotate the optical assembly portion relative to the workpiece surface to nominally align the optical axis of the optical assembly portion with a surface normal of the workpiece surface and adjust a distance between the optical assembly portion and the workpiece surface; and execute a defined operation on the workpiece surface.
A metrology system, comprising:
A method for operating a metrology system including an optical assembly portion, wherein the optical assembly portion comprises:
(canceled)
A metrology system, comprising:
A system, comprising:
A method for operating a system including an optical assembly portion, wherein the optical assembly portion comprises:
Dependencies are inferred from the claim text.