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US 2022/0101505 A1Published application
Print defect detection mechanism
AssigneeRicoh Company, Ltd.
InventorsWalter F. Kailey, Carl M. Dennison
Life of this patent
Estimating the term…
Abstract
A method is disclosed. The method includes receiving one or more images of bitmap data applied to a print medium as print medium image data, register the print medium image data to the bitmap data, detecting one or more candidate defects based on whether a difference between the print medium image data at a location and the bitmap data at the location exceeds a predetermined threshold, detecting one or more defects among the candidate defects and transmitting information about the one or more candidate defects classified as defects.
Claims22
A system comprising:
- at least one physical memory device to store defect detection logic;
- and
- one or more processors coupled with the at least one physical memory device to execute the defect detection logic to:
- receive one or more images of bitmap data applied to a print medium as print medium image data;
- register the print medium image data to the bitmap data;
- detect one or more candidate defects based on whether a difference between the print medium image data at a location and the bitmap data at the location exceeds a predetermined threshold;
- detect one or more defects among the candidate defects, including:
- determining a size of a candidate defect;
- determining that the candidate defect comprises a defect upon a determination that the size of the candidate defect exceeds a critical size threshold;
- computing an original variance value associated with an image included in the bitmap data at a first region associated with the defect;
- computing a difference variance value associated with the bitmap data at the first region and the print medium image data at the first region;
- and
- classifying the defect as an unacceptable defect upon a determination that the original variance value is less than the difference variance value multiplied times a gain value;
- and
- transmit information about the one or more candidate defects classified as defects.
12 more elements
A method comprising:
- receiving one or more images of bitmap data applied to a print medium as print medium image data;
- registering the print medium image data to the bitmap data;
- detecting one or more candidate defects based on whether a difference between the print medium image data at a location and the bitmap data at the location exceeds a predetermined threshold;
- detecting one or more defects among the candidate defects, including:
- determining a size of a candidate defect;
- determining that the candidate defect comprises a defect upon a determination that the size of the candidate defect exceeds a critical size threshold;
- computing an original variance value associated with an image included in the bitmap data at a first region associated with the defect;
- computing a difference variance value associated with the bitmap data at the first region and the print medium image data at the first region;
- and
- classifying the defect as an unacceptable defect upon a determination that the original variance value is less than the difference variance value multiplied times the gain value;
- and
- transmitting information about the one or more candidate defects classified as defects.
9 more elements
At least one computer readable medium having instructions stored thereon, which when executed by one or more processors, cause the processors to:
- receive one or more images of bitmap data applied to a print medium as print medium image data;
- register the print medium image data to the bitmap data;
- detect one or more candidate defects based on whether a difference between the print medium image data at a location and the bitmap data at the location exceeds a predetermined threshold;
- detect one or more defects among the candidate defects, including:
- determining a size of a candidate defect;
- determining that the candidate defect comprises a defect upon a determination that the size of the candidate defect exceeds a critical size threshold;
- computing an original variance value associated with an image included in the bitmap data at a first region associated with the defect;
- computing a difference variance value associated with the bitmap data at the first region and the print medium image data at the first region;
- and
- classifying the defect as an unacceptable defect upon a determination that the original variance value is less than the difference variance value multiplied times the gain value;
- and
- transmit information about the one or more candidate defects classified as defects.
9 more elements
Dependencies are inferred from the claim text.