Parameter search method
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsTeppei OGUNI, Takeshi OSADA, Takahiro FUKUTOME
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsTeppei OGUNI, Takeshi OSADA, Takahiro FUKUTOME
Estimating the term…
A parameter candidate for a semiconductor element is provided. A data set of measurement data is provided to a parameter extraction portion, and a model parameter is extracted. A first netlist is provided to a circuit simulator, simulation is performed using the first netlist and the model parameter, and a first output result is output. A classification model learns the model parameter and the first output result and classifies the model parameter. A second netlist and a model parameter are provided to the circuit simulator. A variable to be adjusted is supplied to a neural network, an action value function is output, and the variable is updated. The circuit simulator performs simulation using the second netlist and the model parameter. When a second output result to be output does not satisfy conditions, a weight coefficient of the neural network is updated. When the second output result satisfies the conditions, the variable is judged to be the best candidate.
A parameter search method using a classification model, a neural network, a parameter extraction portion, a circuit simulator, and a control portion, comprising:
A parameter search method using a classification model, a neural network, a parameter extraction portion, a circuit simulator, and a control portion, comprising:
Dependencies are inferred from the claim text.