System and method of cleaning process chambers using plasma
AssigneeApplied Materials, Inc.
InventorsFei WU, Abdul Aziz KHAJA, Amit Kumar BANSAL, Tuan Anh (Mike) NGUYEN, Qian SUI
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AssigneeApplied Materials, Inc.
InventorsFei WU, Abdul Aziz KHAJA, Amit Kumar BANSAL, Tuan Anh (Mike) NGUYEN, Qian SUI
Estimating the term…
The present disclosure relates to a method for cleaning one or more chamber components having contaminants. The method includes introducing a gas mixture to a remote plasma source, the gas mixture includes argon, an oxygen-containing gas and a nitrogen-containing gas. The argon to oxygen gas ratio in the gas mixture is about 0.2:1 to about 1:1 by volume. A plasma is formed from the gas mixture in the remote plasma source. The plasma includes oxygen radicals, argon radicals, and nitrogen radicals. The plasma is introduced to a process volume of the process chamber and exposes surfaces of one or more chamber components. The process volume of the process chamber has a pressure of about 10 mTorr to about 6 Torr and a temperature above 300° C.
A method of cleaning comprising:
A method of cleaning comprising:
A method comprising:
Dependencies are inferred from the claim text.