Calibration system, calibration method, and calibration device
AssigneeShenzhenshi Yuzhan Precision Technology
InventorsYUAN-KUN YANG, HAN-CHIEH CHANG, CHUN-MING ZHONG, HAI-JUN LI
Life of this patent
Estimating the term…
Loading patent…
AssigneeShenzhenshi Yuzhan Precision Technology
InventorsYUAN-KUN YANG, HAN-CHIEH CHANG, CHUN-MING ZHONG, HAI-JUN LI
Estimating the term…
A calibration system, a calibration method, and a calibration device configured to determine base information of a polish head to polish a workpiece through the polish head are provided. The base information comprises a first position. The calibration system includes the polish head, a controller, and a sensor group. The controller is coupled to the polish head and controls the polish head to move along a first direction. The sensor group detects a force that at least one of the polish head and the workpiece senses to generate a first pressure value. The controller determines whether the first pressure value is greater than a predetermined value. According to that the first pressure value is greater than the predetermined value, the first position is determined.
A calibration system configured to determine base information of a polish head to polish a workpiece through the polish head, the base information comprises a first position, the calibration system comprising:
A calibration method configured to determine base information of a polish head to polish a workpiece through the polish head, the base information comprises a first position, the calibration method comprising:
A calibration system configured to determine base information of a polish head to polish a workpiece through the polish head, the base information comprises a first position, the calibration system comprising:
Dependencies are inferred from the claim text.