Method of forming power grid structures
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHiranmay BISWAS, Chi-Yeh YU, Kuo-Nan YANG, Chung-Hsing WANG, Stefan RUSU, Chin-Shen LIN
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHiranmay BISWAS, Chi-Yeh YU, Kuo-Nan YANG, Chung-Hsing WANG, Stefan RUSU, Chin-Shen LIN
Estimating the term…
A method of forming an IC structure includes forming first and second power rails at a power rail level. First metal segments are formed at a first metal level above the power rail level. Each first metal segment of the plurality of first metal segments overlap one or both of the first power rail or the second power rail. First vias are formed between the power rail level and the first metal level. Second metal segments are formed at a second metal level above the first metal level. At least one second metal segment of the plurality of second metal segments overlaps the first power rail. At least one second metal segment of the plurality of second metal segments overlaps the second power rail. A plurality of second vias are formed between the first metal level and the second metal level.
A method of forming an integrated circuit (IC) structure, the method comprising:
A method of forming an integrated circuit (IC) structure, the method comprising:
A method of forming an integrated circuit (IC) structure, the method comprising:
Dependencies are inferred from the claim text.