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US 2022/0093391 A1Published application
Cleaning substrate method and method of processing substrate using the same
AssigneeSamsung Electronics Co., Ltd.
InventorsYEONGBONG PARK, JISU KIM, BYOUNGHO KWON
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Abstract
A method of processing a substrate may include preparing the substrate, polishing the substrate, and cleaning the substrate using a double nozzle, which is configured to provide a spray and a chemical solution onto the substrate. The spray may include a deionized water, and the chemical solution may be diluted with the deionized water. The chemical solution and the spray may be spaced apart from each other by a distance of 7 cm to 12 cm.
Claims20
A method of processing a substrate, comprising:
- preparing the substrate;
- polishing the substrate;
- and
- cleaning the substrate using a double nozzle, which is configured to provide a spray and a chemical solution onto the substrate, the spray comprising a deionized water and the chemical solution being diluted with the deionized water,
- wherein the chemical solution and the spray are spaced apart from each other by a distance of 7 cm to 12 cm.
2 more elements
A method of cleaning a substrate, comprising:
- moving a double nozzle comprising a high-pressure nozzle configured to provide a spray and a low-pressure nozzle configured to provide a chemical solution onto the substrate at a first speed on a center region of the substrate, the spray comprising a deionized water and the chemical solution being diluted with the deionized water;
- and
- moving the double nozzle at a second speed, which is slower than the first speed, on an edge region of the substrate outside and surrounding the center region of the substrate,
- wherein the low-pressure nozzle and the high-pressure nozzle are spaced apart from each other by a distance of 7 cm to 12 cm.
1 more element
A method of processing a substrate, comprising:
- preparing the substrate;
- polishing the substrate;
- and
- cleaning the substrate,
- wherein the cleaning of the substrate comprises:
- cleaning the substrate using a first double nozzle, which is configured to provide a first spray and a first chemical solution onto the substrate, the first spray comprising a deionized water, the first chemical solution being diluted with the deionized water;
- brushing the substrate using a brush and a second chemical solution, which is different from the first chemical solution, on the substrate;
- and
- recleaning the substrate using a second double nozzle, which is configured to provide a second spray and a third chemical solution onto the substrate, which are the same as the first spray and the first chemical solution, respectively,
- wherein a distance between the first chemical solution and the first spray and a distance between the second spray and the third chemical solution are each in a range of 7 cm to 12 cm.
7 more elements
Dependencies are inferred from the claim text.