Using real time search results to dynamically exclude product ions that may be present in the master scan
AssigneeThermo Finnigan LLC
InventorGraeme C. McALISTER
Life of this patent
Estimating the term…
Abstract
A method includes obtaining a first mass spectrum; selecting a first peak of the first mass spectrum; fragmenting and analyzing ions of the first peak to obtain a second mass spectrum; performing a real-time spectral search for compounds corresponding to peaks in the second mass spectrum; identifying fragments for the compounds identified based on the real-time spectral search; adding mass-to-charge ratios for the fragments to an exclusion list; selecting a second peak present in the first mass spectrum and not on the exclusion list; and fragmenting and analyzing ions of the second peak to obtain a third mass spectrum.
Claims29
A method comprising:
- obtaining a first mass spectrum;
- selecting a first peak of the first mass spectrum;
- fragmenting and analyzing ions of the first peak to obtain a second mass spectrum;
- performing a real-time spectral search for compounds corresponding to peaks in the second mass spectrum;
- identifying fragments for the compounds identified based on the real-time spectral search;
- adding mass-to-charge ratios for the fragments to an exclusion list;
- selecting a second peak present in the first mass spectrum and not on the exclusion list;
- and
- fragmenting and analyzing ions of the second peak to obtain a third mass spectrum.
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A mass spectrometer, comprising:
- an ion source configured to ionize a sample to produce ions;
- a first mass analyzer configured to produce a mass spectrum;
- and
- a controller configured to
- obtain a first mass spectrum using the mass analyzer;
- select a first peak of the first mass spectrum;
- fragment and analyze ions of the first peak to obtain a second mass spectrum using the mass analyzer;
- perform a real-time spectral search for compounds corresponding to peaks in the second mass spectrum;
- identify fragments for the compounds identified based on the real-time search;
- add mass-to-charge ratios for the fragments to an exclusion list;
- select a second peak from the first mass spectrum and not on the exclusion list;
- and
- fragment and analyze ions of the second peak to obtain a third mass spectrum using the mass analyzer.
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A mass spectrometer, comprising:
- an ion source configured to ionize a sample to produce ions;
- a first mass analyzer configured to produce a first mass spectrum at a first mass accuracy or resolution;
- a second mass analyzer configured to produce a second mass spectrum at a second mass accuracy or resolution;
- and
- a controller configured to
- obtain a first mass spectrum using the first mass analyzer;
- select a first peak of the first mass spectrum;
- fragment and analyze ions of the first peak to obtain a second mass spectrum using the second mass analyzer;
- perform a real-time spectral search for compounds corresponding to peaks in the second mass spectrum;
- identify fragments for the compounds identified based on the real-time spectral search;
- add mass-to-charge ratios for the fragments to an exclusion list;
- select a second peak from the first mass spectrum and not on the exclusion list;
- and
- fragment and analyze ions of the second peak to obtain a third mass spectrum using the second mass analyzer.
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Dependencies are inferred from the claim text.