Method For Tuning Work Function Using Surface Photo Voltage and Producing Ultra-Low-Work-Function Surfaces, and Devices Operational Therewith

Abstract

The embodiments provide a thermionic emission device and a method for tuning a work function in a thermionic emission device is provided. The method includes illuminating an N type semiconductor material of a first member of a thermionic emission device, wherein a work function of the N type semiconductor material is lowered by the illuminating. The method includes collecting, on one of the first member or a second member of the thermionic emission device, electrons emitted from one of the first member or the second member.

Dependencies are inferred from the claim text.