Electronic device and method for analyzing reliability of facility

A method for analyzing reliability of facility implemented in an electronic device comprising:

• obtaining alarm data from at least one equipment;
• generating a first prediction parameter and a first algorithm model based on the alarm data and a first model;
• generating a second prediction parameter and a second algorithm model based on the alarm data and a second model;
• determining that the first algorithm model is better than the second algorithm model based on a judgment model, the first prediction parameter, and the second prediction parameter;
• and
• generating an evaluation index based on the first algorithm model, so as to evaluate the reliability of the at least one equipment based on the evaluation index, in response that the first algorithm model is determined to be better than the second algorithm model.

An electronic device for analyzing reliability of facility, comprising:

• a processor coupled to the communicator;
• and
• a memory coupled to the processor and storing instructions, the processor is configured to execute the instructions to:
• obtain alarm data from at least one equipment;
• generate a first prediction parameter and a first algorithm model based on the alarm data and a first model;
• generate a second prediction parameter and a second algorithm model based on the alarm data and a second model;
• determine that the first algorithm model is better than the second algorithm model based on a judgment model, the first prediction parameter, and the second prediction parameter;
• and
• generate an evaluation index based on the first algorithm model, so as to evaluate the reliability of the equipment based on the evaluation index, in response that the first algorithm model is determined to be better than the second algorithm model.