Fault injection in a clock monitor unit
AssigneeNXP USA, Inc.
InventorsPraveen Durga, Parul Bansal
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AssigneeNXP USA, Inc.
InventorsPraveen Durga, Parul Bansal
Estimating the term…
A self-test mechanism within an integrated circuit to test for faulty operation of a clock monitor unit implemented within the integrated circuit for monitoring a clock signal. The mechanism intentionally injects faults into the clock monitor unit to evaluate if the clock monitor unit is operating in accordance with its specified operating parameters. The injected faults are intended to cause the clock monitor unit to determine that the clock signal is operating outside of an artificially generated, imaginary specified frequency range. If the injected faults do not cause the clock monitor unit to determine that the clock signal is operating both above and below the artificially generated, imaginary specified frequency range, then the clock monitor unit is not functioning according to specified operating parameters.
An integrated circuit comprising:
A method for evaluating a clock monitor unit comprising:
A clock monitor unit comprising:
Dependencies are inferred from the claim text.