Memory system and operating method of the memory system
AssigneeSK hynix Inc.
InventorJong Wook KIM
Life of this patent
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Abstract
A memory system, and an operating method of the memory system, includes a memory device including a plurality of semiconductor memories. The memory system also includes a controller for setting a performance period of a garbage collection operation of each of the plurality of semiconductor memories, based on a mobile ion amount of each of the plurality of semiconductor memories, and controlling the garbage collection operation of the plurality of semiconductor memories, based on the set performance period.
Claims20
A memory system comprising:
- a memory device including a plurality of semiconductor memories;
- and
- a controller configured to set a performance period of a garbage collection operation of each of the plurality of semiconductor memories, based on a mobile ion amount of each of the plurality of semiconductor memories, and control the garbage collection operation of the plurality of semiconductor memories, based on the set performance period.
A method for operating a memory system comprising a memory device including a plurality of semiconductor memories and comprising a controller for controlling the memory device, the method comprising:
- performing a program operation on each of the plurality of semiconductor memories;
- performing a read operation on each of the plurality of semiconductor memories after the program operation is completed;
- detecting and counting fail bits, based on a result of the read operation;
- measuring a mobile ion amount of each of the plurality of semiconductor memories, based on the counted number of fail bits;
- and
- storing information on the mobile ion amount of each of the plurality of semiconductor memories in a Content Addressable Memory (CAM) block of each of the plurality of semiconductor memories or the controller.
A method for operating a memory system, the method comprising:
- reading a mobile ion amount stored in a Content Addressable Memory (CAM) block included in each of a plurality of semiconductor memories and storing the read mobile ion amount in a garbage collection controller of a controller;
- setting a performance period of a garbage collection operation of each of the plurality of semiconductor memories, based on the mobile ion amount of each of the plurality of semiconductor memories, which is stored in the garbage collection controller;
- and
- performing the garbage collection operation of a semiconductor memory which reaches the performance period of the garbage collection operation among the plurality of semiconductor memories.
Dependencies are inferred from the claim text.