Survey apparatus and survey program
AssigneeTopcon Corporation
InventorsTakeshi SASAKI, Kaoru KUMAGAI
Life of this patent
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AssigneeTopcon Corporation
InventorsTakeshi SASAKI, Kaoru KUMAGAI
Estimating the term…
A survey apparatus includes: a measurement unit; an imaging unit; an attitude detecting unit being integrally provided with the imaging unit; and a calculation processing unit. The attitude detecting unit has an inclination sensor which detects horizontality and a relative inclination angle detecting portion which inclines the inclination sensor so that the inclination sensor detects horizontality and which detects an inclination angle of the measurement unit relative to the horizontality in a state where the inclination sensor detects horizontality, and the calculation processing unit executes control to ascertain a rough shape of the measurement object on the basis of the image including the measurement object having been imaged by the imaging unit and generate, on the basis of the rough shape, a scan pattern of the ranging light emitted by the measurement unit.
A survey apparatus comprising:
A survey program to be executed by a computer of a survey apparatus including:
Dependencies are inferred from the claim text.