Margin test data tagging and predictive expected margins
AssigneeTektronix, Inc.
InventorsSam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
Life of this patent
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Abstract
A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier. Assessing the margin can include assessing the margin based on an expected margin that is predicted or provided based on the adaptor identifier.
Claims20
A margin tester, comprising:
- an identification reader configured to receive an adaptor identifier of an adaptor;
- an interface configured to connect to a device under test through the adaptor;
- and
- one or more processors configured to assess a margin of a device under test and tag the assessment with the adaptor identifier.
A method for margin testing a device under test, comprising:
- receiving an adaptor identifier at a margin tester;
- determining whether an adaptor is a known adaptor based on the adaptor identifier;
- assessing a margin of a device under test through the adaptor;
- and
- tagging assessment data of the margin of the device under test with the adaptor identifier.
A margin tester, comprising:
- an identification reader configured to receive an adaptor identifier of a high-density adaptor;
- an interface configured to connect to a device under test through the adaptor;
- a margin assessor configured to assess a margin of a device under test;
- and
- a data tagger configured to tag the assessment with the adaptor identifier.
Dependencies are inferred from the claim text.