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AssigneeUniversite Laval
InventorsÉrik BELANGER, Pierre MARQUET, Bertrand DE DORLODOT, Réal VALLÉE
Estimating the term…
There is described a method for determining a refractive index of a medium. The method generally has providing a substrate having a surface, the surface having a first surface portion and a second surface portion spaced-apart from the first surface portion and recessed of a depth relative to the first surface portion; receiving the medium at least on the second surface portion; propagating a first optical beam towards the first surface portion and a second optical beam towards the second surface portion; collecting the first and second optical beams after said propagating and generating first and second signals being indicative of a phase of a respective one of the first and second collected optical beams; and determining a refractive index of said medium based on the first and second signals, the depth, a wavelength associated to the first and second optical beams and a refractive index of the substrate.
A method for determining a refractive index of a medium, the method comprising:
A system for determining a refractive index of a medium, the system comprising:
A substrate for use in determining a refractive index of a medium, the substrate comprising a first surface opposite to a second surface, the first surface having a first surface portion and a second surface portion spaced-apart from the first surface portion and recessed of a given depth relative to the first surface portion, wherein, during use, at least the second surface portion receives the medium, the first surface portion receives a first optical beam and the second surface portion receives a second optical beam, the first and second optical having power within a spectral band at a given wavelength λ, the depth d being given by a relation equivalent to the following relation:
Dependencies are inferred from the claim text.