Terahertz wave attenuated total reflection spectroscopic method, terahertz wave attenuated total reflection spectroscopic device, and pressure application device

A terahertz wave attenuated total reflection spectroscopic device, comprising:

• a terahertz wave output unit outputting a terahertz wave;
• a prism including a reflection surface on which a measurement target is disposed, allowing the terahertz wave output from the terahertz wave output unit to be incident on the reflection surface from a side opposite to the measurement target, and outputting the terahertz wave reflected on the reflection surface;
• a terahertz wave detection unit detecting the terahertz wave output from the prism;
• and
• a pressure application unit applying a pressure to the measurement target disposed on the reflection surface,
• wherein the pressure application unit is configured to be capable of adjusting a magnitude of the pressure.

A pressure application device used in a terahertz wave attenuated total reflection spectroscopic device that allows a terahertz wave to be incident on a reflection surface from a side opposite to a measurement target and detects the terahertz wave reflected on the reflection surface, in a state in which the measurement target is disposed inside a frame body disposed on the reflection surface, the device comprising:

• a support portion attached to the reflection surface and the frame body;
• a contact portion supported by the support portion to be movable along a direction perpendicular to a surface of the measurement target on a side opposite to the reflection surface and in contact with the surface of the measurement target inside the frame body;
• and
• a biasing portion biasing the contact portion against the reflection surface side along the direction perpendicular to the surface of the measurement target.