Sample preparation apparatus, sample preparation system, sample preparation method, and particle analyzer
AssigneeSysmex Corporation
InventorsTakaaki NAGAI, Shinichiro Oguni, Tomohiro Tsuji
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AssigneeSysmex Corporation
InventorsTakaaki NAGAI, Shinichiro Oguni, Tomohiro Tsuji
Estimating the term…
The sample preparation apparatus includes a measurement unit configured to measure a sample containing particles acquired from a sample container and detect measurement target particles in the sample, a sample preparation unit capable of adjusting the concentration of measurement target particles in a sample acquired from a sample container and configured to prepare a measurement sample by mixing a sample and any of a plurality of types of particle detection reagents including a particle labeling substance, and a control unit for controlling the sample preparation unit so as to generate concentration information of the measurement target particles in the sample in the sample container based on the measurement data of the measurement unit and adjust the concentration of the measurement target particles in the sample acquired from the sample container according to the generated concentration information and the type of particle detection reagent used for preparing the measurement sample.
A sample preparation apparatus comprising:
A sample preparation method, comprising:
A sample preparation system comprising:
Dependencies are inferred from the claim text.