Measurement device and method for controlling measurement device
AssigneeTopcon Corporation
InventorNobuyuki NISHITA
Life of this patent
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AssigneeTopcon Corporation
InventorNobuyuki NISHITA
Estimating the term…
To efficiently and accurately detect coordinates positions of a measurement object formed in a linear shape regardless of a distance from a measurement light emitting unit. The provided survey system includes: a distance measuring unit; a deflecting unit for deflecting a direction of measurement light with respect to a reference optical axis and for scanning with the measurement light with respect to a prescribed center in a circumferential direction; and a calculation control unit which controls the distance measuring unit and the deflecting unit, wherein the calculation control unit detects coordinates of intersection points of a measurement object formed in a linear shape and a scan trajectory of the measurement light, and controls a deflection operation of the deflecting unit so that intervals of the intersection points adjacent to each other are constant intervals on the measurement object.
A measurement device, comprising:
A method for controlling a measurement device which performs a measurement of a measurement object,
Dependencies are inferred from the claim text.