Abnormality score calculation apparatus, method, and medium
AssigneeKabushiki Kaisha Toshiba
InventorsJumpei ANDO, Wataru WATANABE, Takayuki ITOH, Toshiyuki ONO
Life of this patent
Estimating the term…
Abstract
An abnormality score calculation apparatus according to an embodiment includes a processing circuit configured to: acquire first data concerning a status of a product or a manufacturing process; calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types; and convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.
Claims13
An abnormality score calculation apparatus comprising a processing circuit configured to:
- acquire first data concerning a status of a product or a manufacturing process;
- calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types;
- and
- convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.
An abnormality score calculation method comprising:
- acquiring first data concerning a status of a product or a manufacturing process;
- calculating based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of different types;
- and
- converting a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.
A non-transitory computer readable medium including computer executable instructions, wherein the instructions, when executed by a processor, cause the processor to perform a method comprising:
- acquiring first data concerning a status of a product or a manufacturing process;
- calculating based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of different types;
- and
- converting a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.
Dependencies are inferred from the claim text.