Interconnection structure and semiconductor package including the same
AssigneeSamsung Electronics Co., Ltd.
InventorsJunyun KWEON, Jumyong PARK, Jin Ho AN, Dongjoon OH, Jeonggi JIN, Hyunsu HWANG
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AssigneeSamsung Electronics Co., Ltd.
InventorsJunyun KWEON, Jumyong PARK, Jin Ho AN, Dongjoon OH, Jeonggi JIN, Hyunsu HWANG
Estimating the term…
Disclosed are interconnection patterns and semiconductor packages including the same. The interconnection pattern comprises a first dielectric layer, a first interconnection pattern in the first dielectric layer, a first barrier layer between the first interconnection pattern and the first dielectric layer, a first top surface of the first barrier layer located at a level lower than that of a second top surface of the first dielectric layer and lower than that of a third top surface of the first interconnection pattern, a second barrier layer on the first barrier layer, the second barrier layer interposed between the first interconnection pattern and the first dielectric layer, a second dielectric layer on the first dielectric layer, the first interconnection pattern, and the second barrier layer, and a second interconnection pattern formed in the second dielectric layer and electrically coupled to the first interconnection pattern.
An interconnection structure, comprising:
An interconnection structure, comprising:
A semiconductor package, comprising:
Dependencies are inferred from the claim text.