Method of controlling substrate transfer system and the substrate transfer system
AssigneeTokyo Electron Limited
InventorsWataru MATSUMOTO, Takehiro SHINDO
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AssigneeTokyo Electron Limited
InventorsWataru MATSUMOTO, Takehiro SHINDO
Estimating the term…
A method of controlling a substrate transfer system including a transfer mechanism having a holder, and a measurement part that detects an outer periphery of the substrate to measure a center position of the substrate, thereby transferring the substrate to a target position, includes: correcting the target position based on an amount of positional deviation between a reference position of the holder and the center position of the substrate, a first amount of thermal displacement of the reference position of the holder by thermal expansion of the transfer mechanism at a measurement position where the outer periphery of the substrate is detected, and a second amount of thermal displacement of the reference position of the holder by the thermal expansion of the transfer mechanism at the target position; and controlling the transfer mechanism such that the reference position of the holder becomes the corrected target position.
A method of controlling a substrate transfer system, the substrate transfer system including a transfer mechanism having a holder configured to hold a substrate and configured to transfer the substrate, and a measurement part configured to detect an outer periphery of the substrate being transferred by the transfer mechanism and measure a center position of the substrate, so as to transfer the substrate to a target position,
A substrate transfer system comprising:
Dependencies are inferred from the claim text.