Test circuit, test device and test method thereof
AssigneeChangxin Memory Technologies, Inc.
InventorLiang ZHANG
Life of this patent
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Abstract
Provided are a test circuit, a test device and a test method thereof. The test circuit includes: a signal processing module configured to receive a pulse signal to be tested and output a processing signal under a control signal; a sampling module connected to the output terminal of signal processing module and configured to receive the processing signal and generate a sampling signal according to the processing signal. The sampling signal includes a first sampling pulse and a second sampling pulse, the first sampling pulse and the second sampling pulse have a pulse width difference, the pulse width difference is equal to the pulse width of the pulse signal.
Claims13
A test circuit, comprising:
- a signal processing module, which is configured to receive a pulse signal to be tested and output a processing signal under a first two signal;
- and
- a sampling module, which is connected to an output terminal of the signal processing module and is configured to receive the processing signal and generate a sampling signal according to the processing signal;
- wherein the sampling signal comprises a first sampling pulse and a second sampling pulse, the first sampling pulse and the second sampling pulse have a pulse width difference, and the pulse width difference is equal to a pulse width of the pulse signal.
A test apparatus, comprising:
- a test circuit, comprising:
- a signal processing module, which is configured to receive a pulse signal to be tested and output a processing signal under a first two signal;
- and
- a sampling module, which is connected to an output terminal of the signal processing module and is configured to receive the processing signal and generate a sampling signal according to the processing signal;
- wherein the sampling signal comprises a first sampling pulse and a second sampling pulse, the first sampling pulse and the second sampling pulse have a pulse width difference, and the pulse width difference is equal to a pulse width of the pulse signal;
- and
- an analysis module, which is connected to the sampling module and is configured to obtain a pulse width of the pulse signal according to the first sampling pulse and the second sampling pulse.
A test method, based on a test device, wherein the method comprising:
- receiving a pulse signal to be tested;
- outputting a processing signal under a control signal;
- generating a sampling signal according to the processing signal, wherein the sampling signal comprises a first sampling pulse and a second sampling pulse;
- and
- obtaining a pulse width of the pulse signal according to the first sampling pulse and the second sampling pulse;
- wherein the first sampling pulse and the second sampling pulse have a pulse width difference, and the pulse width difference is equal to the pulse width of the pulse signal.
Dependencies are inferred from the claim text.