Integrated circuit and test method thereof

An integrated circuit comprising:

• a test control circuit configured to generate a test command signal and a test address signal corresponding to a test operation;
• a driving circuit configured to perform the test operation by utilizing a plurality of test internal voltages, which are generated based on the test command signal;
• and
• a test detection circuit configured to compare the test address signal with target address information to output a test internal voltage corresponding to target voltage information among the plurality of test internal voltages.

A test method of an integrated circuit, the test method comprising:

• storing a test address signal and a test command signal for performing test operations;
• setting target address information corresponding to the test address signal in order to select a particular test operation among the test operations;
• setting target voltage information corresponding to each of a plurality of test internal voltages in order to select a particular test internal voltage among the plurality of test internal voltages, which are utilized during the particular test operation;
• and
• detecting at least one test internal voltage among the plurality of test internal voltages based on the target address information and the target voltage information.