Method and system for testing machine learning models
AssigneeArm Cloud Technology, Inc.
InventorsBernard BURG, Saina LAJEVARDI, Michael LUBINSKY, Yue ZHAO
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AssigneeArm Cloud Technology, Inc.
InventorsBernard BURG, Saina LAJEVARDI, Michael LUBINSKY, Yue ZHAO
Estimating the term…
A method performed by an electronic device for testing machine learning models is described. The electronic device includes a program for executing a first machine learning model and a second machine learning model. The electronic device receives a machine learning model update data package and generates the second machine learning model from the update data package by partially or fully updating the first machine learning model. When the program is executed, both the first and second machine learning model use a common set of input data to perform inference. The program collects outputs from the first machine learning model and the second machine learning model, for further analysis.
A method performed by an electronic device for testing machine learning models, the electronic device comprising a program for executing a first machine learning model and a second machine learning model, the method comprising:
An electronic device comprising a processing element and a data storage element, the storage element storing code that, when executed by the processing element, causes the electronic device to perform a method for testing machine learning models, the method comprising:
A non-transitory computer-readable storage medium containing code that, when executed by an electronic device, causes the electronic device to perform a method for testing machine learning models, the method comprising:
Dependencies are inferred from the claim text.