Block family combination and voltage bin selection
AssigneeMicron Technology, Inc.
InventorsMichael Sheperek, Larry J. Koudele, Mustafa N. Kaynak, Shane Nowell
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AssigneeMicron Technology, Inc.
InventorsMichael Sheperek, Larry J. Koudele, Mustafa N. Kaynak, Shane Nowell
Estimating the term…
A set of two or more block families associated with a first voltage bin are selected. Each block family includes two or more pages of a memory device that have been programmed within a corresponding time window. The set of two or more block families includes a first block family and a second block family. Values of a data state metric for each of the set of block families is determined. A first voltage for the first block family and a second voltage for the second block family is determined based on the values of the data state metric. In response to a determination that a difference between the first voltage and the second voltage satisfies a block family combination criterion, the second block family is merged with the first block family.
A method comprising:
A system comprising:
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
Dependencies are inferred from the claim text.