Optical measurement device and optical measurement method
AssigneeOMRON Corporation
InventorsYosuke KAJII, Tomonori KONDO
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Abstract
Without requiring that threshold values be set for each measurement condition, the present invention makes it possible to determine whether noise that can occur in measured values is present. An optical measurement device acquires measured values on the basis of the amount of reflected light that is received after being reflected by a target. The optical measurement device comprises a setting part for setting a threshold value for the amount of received reflected light per unit time on the basis of feature information regarding the light amount of the optical measurement device and a determination part for determining whether there is measured value noise on the basis of the threshold value.
Claims15
An optical measurement device that acquires a measured value based on a received light amount of reflected light reflected by a target, the optical measurement device comprising:
- a setting part that sets a threshold value for a received light amount per unit time of the reflected light based on feature information regarding a light amount of the optical measurement device;
- and
- a determination part that determines presence or absence of noise in the measured value based on the threshold value.
An optical measurement method using an optical measurement device that acquires a measured value based on a received light amount of reflected light reflected by a target, the optical measurement method comprising:
- a setting step of setting a threshold value for a received light amount per unit time of the reflected light based on feature information regarding a light amount of the optical measurement device;
- and
- a determination step of determining presence or absence of noise in the measured value based on the threshold value.
Dependencies are inferred from the claim text.