Circuit failure detection for diode arrays
AssigneeAms AG
InventorRahim Akbari-Dilmaghai
Life of this patent
Estimating the term…
Abstract
An apparatus and method for circuit failure detection for a diode array. The apparatus includes a diode array, a diode array test circuit electrically coupled to the diode array and operable to perform circuit failure detection during a test mode when a test input voltage is applied, the diode array test circuit includes an input resistor, an input voltage node, a buffered amplifier circuit, and a plurality of amplifier circuit switches. The apparatus further includes a current detector electrically coupled to the output of the buffered amplifier circuit and operable to determine, during the test mode, a current measurement of the pulse laser diode array.
Claims21
1-24. (canceled)
An apparatus, comprising:
- a diode array;
- a diode array test circuit electrically coupled to the diode array and operable to perform circuit failure detection during a test mode when a test input voltage is applied, the diode array test circuit comprising:
- an input resistor operable to traverse a test current from the diode array, the diode array electrically coupled to a bottom end of the input resistor;
- an input voltage node, wherein a top end of the input resistor is electrically coupled to the input voltage node;
- a buffered amplifier circuit comprising:
- an amplifier comprising:
- an inverting input electrically coupled to a first input of the buffered amplifier circuit and the input voltage node;
- and
- a noninverting input electrically coupled to the test input voltage;
- and
- a plurality of amplifier circuit switches, wherein at least one amplifier circuit switch is electrically coupled to an output of the amplifier, wherein at least one amplifier circuit switch is electrically coupled to an output of the buffered amplifier circuit;
- and
- a current detector electrically coupled to the output of the buffered amplifier circuit and operable to determine, during the test mode, a current measurement of the diode array.
A method for circuit failure detection comprising:
- applying, during a test mode of a diode array, a test input voltage to an amplifier of buffered amplifier circuit located in a diode array test circuit electrically coupled to the diode array;
- detecting, by a current detector electrically coupled to an output of buffered amplifier circuit, an output signal from the output of the buffered amplifier circuit;
- determining, by the current detector and based on the output signal, a test current of the diode array;
- and
- determining, by the current detector, whether the test current indicates a level of failure of the diode array that exceeds a failure threshold.
Dependencies are inferred from the claim text.