Probe pin inspection mechanism and inspection apparatus

A probe pin inspection mechanism, comprising:

• a base;
• a pair of movable bodies respectively including ends and terminals, each of the pair of movable bodies being supported by the base to be movable in a first direction from a first position with respect to the base, the ends being located in a second direction opposite to the first direction, the terminals being electrically connected to the respective ends, and the pair of movable bodies being arranged in a direction intersecting the first direction;
• a pair of movable-body elastic bodies provided for the respective movable bodies and interposed between the respective movable bodies and the base, the pair of movable-body elastic bodies elastically pressing the respective movable bodies in the second direction;
• and
• a conductor supported by the base, the conductor electrically connecting the terminals of the pair of movable bodies by making contact with the terminals, wherein the ends of the pair of movable bodies are capable of making contact with respective probe pins, and
• a state between the terminals and the conductor is switched, according to a position of the movable bodies, between a conductive state in which the terminals and the conductor are in contact with each other and a non-conductive state in which the terminals and the conductor are separated from each other.