Method for acculately characterizing crystal three-dimensional orientation and crystallographic orientation

A method for accurately characterizing a crystal three-dimensional orientation and a crystallographic orientation, comprising the following steps:

• S1. acquiring two-dimensional structure topographies of a series of cross sections in an area to-be-detected of a crystal material;
• S2. acquiring an EBSD pattern in the area to-be-detected;
• S3. using a three-dimensional image analysis software to perform three-dimensional image synthesis on the series of the two-dimensional structure topography acquired in step S1, to acquire a three-dimensional topography;
• S4. establishing a conversion relationship between a crystallographic coordinate system acquired by EBSD and a coordinate system of the three-dimensional topography;
• S5. extracting a three-dimensional orientation of a characteristic topography in the coordinate system from the three-dimensional topography synthesized in step S3;
• and
• S6. converting the three-dimensional orientation of the characteristic topography in step S5 into the crystallographic coordinate system acquired by EBSD, to obtain the crystallographic orientation of the characteristic topography.